000 00483nab a2200133Ia 4500
008 230808s2003 |||||||f |||| 00| 0 eng d
100 _aDas, S
100 _aSudarma, Made
_9810956
245 0 _aParity Bit Signature in Response Data Compaction and Built -In Self-Testing of Vlsi Circuits with Nonexhaustive Test Sets
300 _a1363-1380 p.
650 _aData Compaction
_9147748
773 _d2003
_tIeee Transactions on Instrumentation and Measurement
_x00189456
942 _cART
_o51
_pABUL KALAM Library
999 _c763533
_d763533