| 000 | 00413nab a2200133Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2003 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aMeyer, F.J _9772973 |
||
| 100 |
_aPark, Nohpill _9809065 |
||
| 245 | 0 | _aPridicting Defect-tolerent Yield InEmbedded Core Context | |
| 300 | _a1470-1479 p. | ||
| 650 |
_aYield Defect tolerance _9809067 |
||
| 773 |
_d2003 _tIEEE TransactionsonComputers _x00189340 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c761998 _d761998 |
||