| 000 | 00420nab a2200133Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2003 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aSeekamp, A. _9806238 |
||
| 100 |
_aAvellan, F _9806239 |
||
| 245 | 0 | _aSimple Estimation ofEffect of Hot-Carrier Degradation on Scale Nmosfets | |
| 300 | _a607-612 p. | ||
| 650 |
_aEstimation _9172959 |
||
| 773 |
_d2003 _tInternational Journal of Electronics _x00207217 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c759785 _d759785 |
||