| 000 | 00503nab a2200145Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2004 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aXiong, Shiying _9797111 |
||
| 100 |
_aBoker, Jeff _9803373 |
||
| 245 | 2 | _aA Simulation Study of Gate Line Edge Roughness Effects on Doping Profiles of Short-Channel Mosfet Devices | |
| 300 | _a228-232 p. | ||
| 650 |
_aDoping _9725227 |
||
| 650 |
_aGate Line Edge Roughness _9803374 |
||
| 773 |
_d2004 _tIeee Journal of Solid-State Circuits _x00189200 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c757686 _d757686 |
||