| 000 | 00434nab a2200133Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2004 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aWei, T. _9802593 |
||
| 245 | 0 | _aEffect of Mobile Charge on Hot-Carrier Degradation in Lateral Diffused Mosfet | |
| 300 | _a554-559 p. | ||
| 650 |
_aHot Carrier Degradation _9780626 |
||
| 650 |
_aHot-Hole _9802594 |
||
| 773 |
_d2004 _tIeee Transactions on Electron Devices _x00189383 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c757256 _d757256 |
||