000 00560nab a2200157Ia 4500
008 230808s2004 |||||||f |||| 00| 0 eng d
100 _aNair, Deleep R
_9797298
100 _aShukuri, S
_9797299
100 _aMahapatra, S
_9745385
245 0 _aCycling Endurance of Nor Flash Eeprom Cells Under Chisel Programming Operation---Impact of Technological Parameters and Scaling
300 _a1672-1679 p.
650 _aHot Carriers
_9771266
650 _aDevice Scaling
_9797302
773 _d2004
_tIeee Transactions on Electron Devices
_x00189383
942 _cART
_o51
_pABUL KALAM Library
999 _c753667
_d753667