000 00376nab a2200121Ia 4500
008 230808s2005 |||||||f |||| 00| 0 eng d
100 _aCellere, Giorgio
_9793697
245 0 _aInfluence of Dielectric Breakdown on Mosfet Drain Current
300 _a211-217 p.
650 _aBreakdown
_9716472
773 _d2005
_tIeee Transactions on Electron Devices
_x00189383
942 _cART
_o51
_pABUL KALAM Library
999 _c751616
_d751616