| 000 | 00524nab a2200157Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s1982 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aMazumder, P. _9792018 |
||
| 100 |
_aPatel, Janak K. _9792019 |
||
| 245 | 0 | _aParaliel Testing for Pattern-Sensitive Faults in Semiconductor Random-Access Memories | |
| 300 | _a394-407 p. | ||
| 650 |
_aMemory Testing _9783692 |
||
| 650 |
_aDynamic Pattern-Sensitive Fault _9792020 |
||
| 650 |
_aRam _9764969 |
||
| 773 |
_d1982 _tIEEE Transactions on Computers _x00189340 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c750512 _d750512 |
||