000 00545nab a2200157Ia 4500
008 230808s2007 |||||||f |||| 00| 0 eng d
100 _aTseng, K F
_9787048
100 _aHsion, Y H
_9787050
245 2 _aA Multifunctional Test Chip for Microelectronic Packaging and Its Application on Rf Property Measurements
300 _a633-643 p.
650 _aMultifunctional Test Chip
_9787052
650 _aRlc Measurement
_9787054
650 _aInductance
_9762610
773 _d2007
_tInternational Journal of Electronics
_x00207217
942 _cART
_o51
_pABUL KALAM Library
999 _c747922
_d747922