000 | 00545nab a2200157Ia 4500 | ||
---|---|---|---|
008 | 230808s2007 |||||||f |||| 00| 0 eng d | ||
100 |
_aTseng, K F _9787048 |
||
100 |
_aHsion, Y H _9787050 |
||
245 | 2 | _aA Multifunctional Test Chip for Microelectronic Packaging and Its Application on Rf Property Measurements | |
300 | _a633-643 p. | ||
650 |
_aMultifunctional Test Chip _9787052 |
||
650 |
_aRlc Measurement _9787054 |
||
650 |
_aInductance _9762610 |
||
773 |
_d2007 _tInternational Journal of Electronics _x00207217 |
||
942 |
_cART _o51 _pABUL KALAM Library |
||
999 |
_c747922 _d747922 |