| 000 | 00587nab a2200169Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s1998 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aSelmi, Luca _9776126 |
||
| 100 |
_aWong, H-S. Philip _9780565 |
||
| 100 |
_aSangiorgi, Enrico _9780566 |
||
| 245 | 0 | _aMonitoring Hot-Carrier Degradation in Soi Mosfets' by Hot -Carrier Luminescence Techniques | |
| 300 | _a1135-1139 p. | ||
| 650 |
_aHot Carriers _9771266 |
||
| 650 |
_aLuminescence _9223777 |
||
| 650 |
_aSemiconductor Device Reliability _9780568 |
||
| 773 |
_d1998 _tIEEE Transactions on Electron Devices _x00189383 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c745271 _d745271 |
||