| 000 | 00579nab a2200169Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s1998 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aHess, K _9780536 |
||
| 100 |
_aKizilyalil, Lsik C. _9780537 |
||
| 100 |
_aLyding, Joseph W. _9780538 |
||
| 245 | 0 | _aGiant Isotope Effect in Hot Electron Degradation of Metal Oxide Silicon Devices | |
| 300 | _a406-416 p. | ||
| 650 |
_aCharge Carrier Processes _9771264 |
||
| 650 |
_aCmos Integrated Circuit _9761245 |
||
| 650 |
_aTransistor Array _9713999 |
||
| 773 |
_d1998 _tIEEE Transactions on Electron Devices _x00189383 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c745255 _d745255 |
||