000 00459nab a2200145Ia 4500
008 230808s1999 |||||||f |||| 00| 0 eng d
100 _aLee, Sang-Yun
_9780366
100 _aSchroder, Dieter K.
245 0 _aMeasurement Time Reduction for Generation lifetimes
300 _a1016-1021 p.
650 _aCharge Carrier lifetime
_9730853
650 _aMos Capacitor
_9769357
773 _d1999
_tIEEE Transactions on Electron Devices
_x00189383
942 _cART
_o51
_pABUL KALAM Library
999 _c745180
_d745180