000 00461nab a2200145Ia 4500
008 230808s1998 |||||||f |||| 00| 0 eng d
100 _aChung, Sang-Koo
_9742451
245 0 _aInjuection Currents Analysis of Buffer Junction
300 _a1850-1853 p.
650 _aBuffer Layer
_9714899
650 _aInjection Dependent lifetime
_9780326
650 _aPower Devices
_9707675
773 _d1998
_tIEEE Transactions on Electron Devices
_x00189383
942 _cART
_o51
_pABUL KALAM Library
999 _c745167
_d745167