000 | 00548nab a2200169Ia 4500 | ||
---|---|---|---|
008 | 230808s1999 |||||||f |||| 00| 0 eng d | ||
100 |
_aIniguez, B _9780090 |
||
100 |
_aDesSARd, V _9780092 |
||
100 |
_aFlandre, D _9780093 |
||
245 | 2 | _aA Physicaliy-Based Continuous Model for Accumulation-Mode Soi Pmosfet'S | |
300 | _a2295-2303 p. | ||
650 |
_aCapacitance Measurement _9777238 |
||
650 |
_aContact Modeling _9780094 |
||
650 |
_aSoi Mosfet _9716592 |
||
773 |
_d1999 _tIEEE Transactions on Electron Devices _x00189383 |
||
942 |
_cART _o51 _pABUL KALAM Library |
||
999 |
_c745056 _d745056 |