000 00548nab a2200169Ia 4500
008 230808s1999 |||||||f |||| 00| 0 eng d
100 _aIniguez, B
_9780090
100 _aDesSARd, V
_9780092
100 _aFlandre, D
_9780093
245 2 _aA Physicaliy-Based Continuous Model for Accumulation-Mode Soi Pmosfet'S
300 _a2295-2303 p.
650 _aCapacitance Measurement
_9777238
650 _aContact Modeling
_9780094
650 _aSoi Mosfet
_9716592
773 _d1999
_tIEEE Transactions on Electron Devices
_x00189383
942 _cART
_o51
_pABUL KALAM Library
999 _c745056
_d745056