000			00529nab a2200157Ia 4500
008			230808s1998 |||||||f |||| 00| 0 eng d
100			_aAng, D. S. _9771940
100			_aling, C. H. _9771953
245		0	_aU Nified Model for Self-limiting Hot-Carrier Degradation in Ldd N-Mopdfet'S
300			_a149-159 p.
650			_aColor Image _9719046
650			_aGate-To-Drain Capacitance _9779568
650			_aMeteor-Burst Communications _9779569
773			_d1998 _tIEEE Transactions on Electron Devices _x00189383
942			_cART _o51 _pABUL KALAM Library
999			_c744824 _d744824