| 000 | 00619nab a2200169Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s1999 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aLee, Zachary K. _9779467 |
||
| 100 |
_aMclirath, Michael B. _9779468 |
||
| 100 |
_aAntoniadis, Dimitri A. _9779471 |
||
| 245 | 0 | _aTwo-Dimensional Doping Profile Characterization of Mosfet'S by Inverse Modeling Using Characteristics InSubthreshold Region | |
| 300 | _a1640-1649 p. | ||
| 650 |
_aDoping Profiles _9779472 |
||
| 650 |
_aHalo Doping _9717361 |
||
| 650 |
_aInverse Modelilng _9698750 |
||
| 773 |
_d1999 _tIEEE Transactions on Electron Devices _x00189383 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c744786 _d744786 |
||