000 | 00540nab a2200169Ia 4500 | ||
---|---|---|---|
008 | 230808s1998 |||||||f |||| 00| 0 eng d | ||
100 |
_aBrennan, S _9719251 |
||
100 |
_aChriss, M. F. _9779313 |
||
100 |
_aWhite, White _9779315 |
||
245 | 0 | _aElectron Beam Induced Current Imaging of Near-Contact Regions in Semi-Insulating Gaas | |
300 | _a2024-2031 p. | ||
650 |
_aContacts _9707274 |
||
650 | _aElectric Fields | ||
650 |
_aSemi-Ipns _9770256 |
||
773 |
_d1998 _tIEEE Transactions on Electron Devices _x00189383 |
||
942 |
_cART _o51 _pABUL KALAM Library |
||
999 |
_c744721 _d744721 |