| 000 | 00592nab a2200169Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s1998 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aMaeda, Shigenobu _9777246 |
||
| 100 |
_aMaegawa, Masumi _9714386 |
||
| 100 |
_aIpposhi, Talashi _9778059 |
||
| 245 | 3 | _aAn Analytical Method of Evaluating Variation OfThreshold Voltage Shift Caused byNegative-Bias Temperature Stress in Poly-Si Tft'S | |
| 300 | _a165-172 p. | ||
| 650 |
_aAnalytical _9714372 |
||
| 650 | _aVariation | ||
| 650 |
_aPoly-Si Tft _9777397 |
||
| 773 |
_d1998 _tIEEE Transactions on Electron Devices _x00189383 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c744191 _d744191 |
||