| 000 | 00583nab a2200169Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s1999 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aTam, S. W. B. _9777233 |
||
| 100 |
_aLui, O. K. B. _9777235 |
||
| 100 |
_aQuinn, M. J. _9777236 |
||
| 245 | 0 | _aObservation Of"Capactiance Overshoot" InTransient Currednt Measurement of Polysilicon Tft'S | |
| 300 | _a134-144 p. | ||
| 650 |
_aCapacitance Measurement _9777238 |
||
| 650 |
_aCurrent Measurement _9741454 |
||
| 650 |
_aTransient Analysis _9752878 |
||
| 773 |
_d1999 _tIEEE Transactions on Electron Devices _x00189383 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c743871 _d743871 |
||