000 00632nab a2200169Ia 4500
008 230808s2004 |||||||f |||| 00| 0 eng d
100 _aKer, Ming-Dou
_9345909
100 _aChang, Chyh-Yih
_9774401
100 _aChang, Yi-Shu
_9774402
245 0 _aEsd Protection Design to Overcome Internal Damage on Interface Circuits of a Cmos Ic with Multiple Separated Power Pins
300 _a445-451 p.
650 _aElectrostatic Discharge (Esd)
650 _aEsd Protection Circuit
_9768181
650 _aInternal Bond
_9774403
773 _d2004
_tIEEE Transactions on Components and Packaging Technologies
_x15213331
942 _cART
_o51
_pABUL KALAM Library
999 _c742643
_d742643