000 | 00557nab a2200157Ia 4500 | ||
---|---|---|---|
008 | 230808s2003 |||||||f |||| 00| 0 eng d | ||
100 |
_aSteininger, andreas _9773647 |
||
100 |
_aThalier, Karl _9773649 |
||
245 | 2 | _aA Transparent Online Memory Test for Simultaneous Detection of Functional Faults and Soft Errors in Memories | |
300 | _a413-422 p. | ||
650 |
_aBuilt-In Self-Test (Bist) _9767031 |
||
650 |
_aCoupling Faults _9773651 |
||
650 |
_aMarch Tests _9773652 |
||
773 |
_d2003 _tIEEE Transactions on Reliability _x00189529 |
||
942 |
_cART _o51 _pABUL KALAM Library |
||
999 |
_c742362 _d742362 |