000 00557nab a2200157Ia 4500
008 230808s2003 |||||||f |||| 00| 0 eng d
100 _aSteininger, andreas
_9773647
100 _aThalier, Karl
_9773649
245 2 _aA Transparent Online Memory Test for Simultaneous Detection of Functional Faults and Soft Errors in Memories
300 _a413-422 p.
650 _aBuilt-In Self-Test (Bist)
_9767031
650 _aCoupling Faults
_9773651
650 _aMarch Tests
_9773652
773 _d2003
_tIEEE Transactions on Reliability
_x00189529
942 _cART
_o51
_pABUL KALAM Library
999 _c742362
_d742362