| 000 | 00582nab a2200169Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2000 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aMohammadi, Saeed Seif _9716112 |
||
| 100 |
_aPavlidis, Dimitris _9771970 |
||
| 100 |
_aBayraktaroglu, Burhan _9771971 |
||
| 245 | 0 | _aRelation Between Low-Frequency Noise and Long-Term Reliability of Single Algaas/Gaas Power Hbt'S | |
| 300 | _a677-686 p. | ||
| 650 |
_aRelationship _9740908 |
||
| 650 |
_aNoise _992865 |
||
| 650 |
_aLong Term Change _9720005 |
||
| 773 |
_d2000 _tIEEE Transactions on Electron Devices _x00189383 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c741702 _d741702 |
||