| 000 | 00556nab a2200169Ia 4500 | ||
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| 008 | 230808s2000 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aZanchi, Alfio _9758655 |
||
| 100 |
_aZappa, Franco _9770958 |
||
| 100 |
_aGhioni, Massimo _9770960 |
||
| 245 | 2 | _aA Probe Detector for Defectivity Assessment in P-N Junctions | |
| 300 | _a609-616 p. | ||
| 650 |
_aGettering _9770962 |
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| 650 |
_aIntegrated Circuitmanufacture _9770964 |
||
| 650 |
_aManufacturing Testing _9770965 |
||
| 773 |
_d2000 _tIEEE Transactions on Electron Devices _x00189383 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c741296 _d741296 |
||