| 000 | 00605nab a2200169Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2000 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aVogel, Eric M. _9770952 |
||
| 100 |
_aHenson, W. Kirklen _9770953 |
||
| 100 |
_aSuehle, John S. _9770954 |
||
| 245 | 0 | _alimitations of Conductance ToMeasurement OfInterface State Density of Mos Capacitoras with Tunneling Gate Gate Dielectrdics | |
| 300 | _a 601-608 p. | ||
| 650 |
_aCapacitance _9707591 |
||
| 650 |
_aConductance _9770956 |
||
| 650 |
_aDielectric Films _9496077 |
||
| 773 |
_d2000 _tIEEE Transactions on Electron Devices _x00189383 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c741294 _d741294 |
||