000 | 00586nab a2200157Ia 4500 | ||
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008 | 230808s2005 |||||||f |||| 00| 0 eng d | ||
100 |
_aKim, Yougduk _9759032 |
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100 |
_aPark, Sekwang _9759033 |
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245 | 0 | _aAnalysis OfInfluence OfAddress Electrode Width on High-Speed Addressing UsingVt Close Curve and Dynamic V Data Margin | |
300 | _a183-190 p. | ||
650 |
_aAddress Discharge _9759034 |
||
650 |
_aPlasma Display Panel _9741434 |
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650 |
_aVt Close Curve _9759035 |
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773 |
_d2005 _tInternational Transactions on Electrophysics and Applications _x15982610 |
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942 |
_cART _o51 _pABUL KALAM Library |
||
999 |
_c735919 _d735919 |