| 000 | 00788nam a2200241Ia 4500 | ||
|---|---|---|---|
| 008 | 020823s1992||||xx |||||||||||||| ||eng|| | ||
| 020 | _a0139118012 | ||
| 022 | _l0-13-911801-2 | ||
| 041 | _aeng | ||
| 082 |
_a621.3815 _bWEY |
||
| 100 |
_aWeyerer, Manfred _eAU _995176 |
||
| 245 | 0 | _aTestability of Electronic Circuits | |
| 260 |
_aMunich : _bCarl Hanser Verlag, _cc1992 |
||
| 300 |
_aXV, 232 p. _b: ill |
||
| 504 | _aYY | ||
| 650 |
_aDigital Electronics Testing _995177 |
||
| 650 |
_aElectronic Circuit Design _977644 |
||
| 650 |
_aElectronic Circuits Testing _995178 |
||
| 700 |
_aGoldemund, Gerald _eAU _995179 |
||
| 700 |
_aSelke, Klaus _eTR _93079 |
||
| 856 |
_yTable of Contents _uhttps://eaklibrary.neduet.edu.pk:8443/catalog/bk/books/toc/0-13-911801-2.pdf |
||
| 942 |
_cBOO _o51 _pAbul Kalam Library |
||
| 999 |
_c377554 _d377554 |
||