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A Physicaliy Based Compact Model of Partialiy Depleted Soi Mosfets for Analog Circuit Simulation by
  • Lee, Mike S. L
  • Tenbroek, Bernard M
  • Redman-White, Wililam
Source: IEEE Journal of Solid-State Circuits
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Industrial Application of Heterostructure Device Simulation by
  • Palankovski, Vassil
  • Quay, Rudiger
Source: IEEE Journal of Solid-State Circuits
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Tpta; Resostance Slope-Based Effective Channel Mobility Extraction Method for Deep Submicrometer Cmos Technology by
  • Niu, Guofu
  • Cressler, John D
  • Mathew, Suraj J
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Modeling of Smali-Signal Minority-Carrier Transport in Bipolar Devices at Arbitrary Injection Levels by
  • Rinaldi, Niccolo F
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Compact Model for Multiterminal Bipolar Devices Used in Smart Power Applications by
  • Speciale, Nicolo
  • Leone, Alberto
  • Privitera, Giuseppe
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Soi Mosfet with Buried Body Strap by Wafer Bonding by
  • Kuehne, Stephen C
  • Chan, Alice Y. W
  • Nguyen, Cuong T
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Effects of Transver5se Dopiong Variations onTransient Response of Silicon Avalanche Shaper Devvices by
  • Jalali, B
  • Joshi, R. R
  • Gaudet, John A
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Analysis and Modeling of Smali-Signal Bipolar Transistor Operation at Arbitrary Injection Levels by
  • Rinaldi, N. F
  • Graaff, H. C. De
  • Fujino, Y
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Monte Carlo Simulation and Measurement of Nanoscale N-Mosfets by
  • Bufler, F.M
  • Asahi, Yoshinori
  • Fichtner, Wolfgang
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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