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		Electronic Devices and Circuits (358) by Bogart, Theodore F [author] Beasley, Jeffrey S [author] Rico, Guillermo [author] Edition: 6th Material type: Text Language: English Publication details: Delhi : Pearson Education, c2004 Online access: Table of Contents Availability: Items available for loan: Book Bank (28)Location, call number: Book Bank 621.3815 BOG, ...
		Transistors How to Test Them How to Build all Transistor Test Equipment Material type: Text Language: English Publication details: Mumbai : D B Taraporevala, 1969 Availability: Items available for loan: Circulation Section (1)Location, call number: Circulation Section 621.381528028 TRA.
		Electronic Products Handbook with Circuit Diagram by National Institute of Industrial Research Board of Consultants and Engineers Material type: Text; Literary form: Language: English Publication details: Delhi : Asia Pacific Business Press, Online access: Table of Contents Availability: Items available for loan: Reference Section (1)Location, call number: Reference Section 621.381029 ELE.
		Pal Device Data Book and Design Guide by Advanced Micro Devices Material type: Text Language: English Publication details: Sunnyvale, CA : Advanced Micro Devices, 1995 Availability: Items available for loan: Reference Section (1)Location, call number: Reference Section 005.71102 PAL.
		Pal Device Data Book by Advanced Micro Devices Material type: Text Language: English Publication details: Sunnyvale, CA : Advanced Micro Devices, c1992 Availability: Items available for loan: Reference Section (1)Location, call number: Reference Section 005.71102 PAL.
		Electronic Devices Conventional Current Version by Floyd, Thomas L [author] Edition: 10th Material type: Text Language: English Publication details: New York, Ny : Pearson, c2018 Online access: Publisher Information Table of Contents Availability: Items available for loan: Circulation Section (1)Location, call number: Circulation Section 621.381 FLO.
		Principles of Electronic Materials and Devices by Kasap, Safa O [author] Edition: 4th Material type: Text Language: English Publication details: New York, Ny : McGraw-Hill Education, c2018 Online access: Publisher Information Table of Contents Availability: Items available for loan: Circulation Section (3)Location, call number: Circulation Section 621.3 KAS, ...
		Component Technology and Standardization I by Aerospace Electronic Systems Department Material type: Text Language: English Publication details: New York : General Electric Company, c1983 Availability: Items available for loan: Reference Section (1)Location, call number: Reference Section 621.381330218 AER.
		Component Technology and Standardization Ii by Aerospace Electronic Systems Department Material type: Text Language: English Publication details: New York : General Electric Company, c1983 Availability: Items available for loan: Reference Section (1)Location, call number: Reference Section 621.381330218 AER.
		Component Technology and Standardization Iii by Aerospace Electronic Systems Department Material type: Text; Literary form: Language: English Publication details: New York : General Electric Company, Availability: Items available for loan: Reference Section (1)Location, call number: Reference Section 621.381330218 AER.
		Civil and Environmental Engineering Test Equipment Catalogue by Ele International Lancaster, Kathleen Landis [editor] Edition: 9th Material type: Text Language: English Publication details: Hertfordshire : Ele International, c1993 Availability: Items available for loan: Reference Section (1)Location, call number: Reference Section 628.0284 ELE.
		Catalyst 2950 Switch Hardware Guide by Cisco Systems Material type: Text Language: English Publication details: San Jose, CA : Cisco Systems, 2003 Availability: Items available for loan: Reference Section (1)Location, call number: Reference Section 004.66 CIS.
		Iedm Technical Digest International Electron Devices Meeting 1986 Los Angeles CA December 7-10, 1986 by Electron Devices Society of Ieee Material type: Text Language: English Publication details: New York : Ieee, c1986 Availability: Items available for loan: Reference Section (1)Location, call number: Reference Section 621.381 IED.
		Electrical Overstress Electrostatic Discharge Symposium Proceedings Held at Orlando Florida on September 21-23, 1982 by Iit Research Institute Material type: Text Language: English Publication details: New York : Reliability Analysis Center, c1983 Availability: Items available for loan: Reference Section (1)Location, call number: Reference Section 621.381 ELE.
		Electrical Overstress Electrostatic Discharge Symposium Proceedings Held at Las Vegas Nevada on September 22-24, 1981 by Iit Research Institute Material type: Text Language: English Publication details: Griffiss Afb, Ny : Reliabity Andysis Center, c1982 Availability: Items available for loan: Reference Section (1)Location, call number: Reference Section 621.381 ELE.
		Fifteenth IEEE Chmt International Electronics Manufacturing Technology Symposium Electronics Manufacturing for the Year 2000 Proceedings 1993 Iemt Symposium October 4-6, 1993 Santa Clara CA Usa by The Electronic Industries Association/IEEE Components Hybrids and Manufacturing Technology Society Material type: Text Language: English Publication details: Piscataway, Nj : Institute of Electrical and Electronics Engineers, c1993 Online access: Table of Contents Availability: Items available for loan: Reference Section (1)Location, call number: Reference Section 621.381 FIF.

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