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		Transistors How to Test Them How to Build all Transistor Test Equipment Material type: Text Language: English Publication details: Mumbai : D B Taraporevala, 1969 Availability: Items available for loan: Circulation Section (1)Location, call number: Circulation Section 621.381528028 TRA.
		Electronic Test Instruments Analog and Digital Measurements by Witte, Robert A [author] Edition: 2nd Material type: Text Language: English Publication details: Delhi : Pearson Education, c2002 Online access: Table of Contents Availability: Items available for loan: Reference Section (1)Location, call number: Reference Section 621.37 WIT.
		Burn in Testing Its Quantification and Optimization by Kececioglu, Dimitri [author] Sun, Feng-Bin [author] Series: Reliability Series Material type: Text Language: English Publication details: New Jersey : Prentice-Hall, c1997 Online access: Table of Contents Availability: Items available for loan: Circulation Section (1)Location, call number: Circulation Section 621.381548 KEC.
		Test System Design a Systematic Approach by Tursky, Christine [author] Cowie, Scott [author] Gordon, Rodney [author] Material type: Text Language: English Publication details: Upper Saddle River, Nj : Prentice-Hall Ptr, c2001 Online access: Table of Contents Availability: Items available for loan: Circulation Section (1)Location, call number: Circulation Section 658.577 TUR.
		How to Test Almost Everything Electronic by Horn, Delton T [author] Edition: 3nd Material type: Text Language: English Publication details: New York : Tab Books, c1993 Online access: Table of Contents Availability: Items available for loan: Circulation Section (1)Location, call number: Circulation Section 621.3810287 HOR.

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