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Fault Diagnosis of Analog Integrated Circuits by
  • Kabisatpathy, Prithviraj [author]
  • Barua, Alok [author]
  • Sinha, Satyabroto [author]
Series: Frontiers in Electronic Testing ; V. 30
Material type: Text Text
Language: English
Publication details: Dordrecht : Springer, c2005
Online access:
Availability: Items available for loan: Circulation Section (2)Location, call number: Circulation Section 621.3815 KAB, ...
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Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits by
  • Bushnell, Michael L [author]
  • Agrawal, Vishwani D [author]
Series: Frontiers in Electronic Testing
Material type: Text Text
Language: English
Publication details: New York : Springer, c2000
Online access:
Availability: Items available for loan: Circulation Section (1)Location, call number: Circulation Section 621.395 BUS.
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