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Full-Wave Rectifier Realization Using only Two Ccii+S and Nmos Transistors by
  • Yuce, E
  • Minaei, S
  • Cicekoglu, O
Source: International Journal of Electronics
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Characterization of Defect Traps in Sio2 Thin Films Influence of Temperature on Defects by
  • Eosaye, Jean-Yves
  • Kurumado, Norihiko
  • Sakashita, Mitsukuni
  • Ikeda, Hiroaki
Source: Microelectronics Journal
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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