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Rapid Thermal Postoxidation Anneal Engineering in Thin Gate Oxides with Al Gates by
  • Chen, Chih-Yao
  • Hwu, Jenn-GWO
  • Jeng, Ming-Jer
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Highway-Rail Quad Gate Operation Time By System Simulation of Dynamic Dilemma Zone by
  • Moon, Young J
  • Coleman Iii, Fred
Source: Asce: Journal of Transportation Engineering
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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