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Analysis and Application of Digital Spectral Warping in Analog and Mixed-Signal Testing by
  • Bailey, Donald G
  • Piuri, Vincenzo
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
An on-Chip Active Decoupling Circuit to Supress Crosstalk in Deep-Submicron Cmos Mixed-Signal Socs by
  • Tsukada, toshiro
  • Hashimoto, Yasuyuki
Source: Ieee Journal of Solid-State Circuits
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
R-Br Ladder Networks for Design of High-Accuracy Static Analog Memories by
  • Scandurra, G
Source: Ieee Transactions on Circuits and Systems, I: Fundamental Theory and Applications
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A High-Speed Ic Random-Number Source for Smart Card Microcontrollers by
  • Bucci, M
Source: Ieee Transactions on Circuits and Systems, I: Fundamental Theory and Applications
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Nand/Nor Adiabatic Gates: Power Consumption Evaluation and Comparison VersusFan-In by
  • Alioto, M
Source: Ieee Transactions on Circuits and Systems, I: Fundamental Theory and Applications
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Charge-Pump Circuits: Power-Consumption Optimization by
  • Palumbo, G
Source: Ieee Transactions on Circuits and Systems, I: Fundamental Theory and Applications
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A 4-Ghz Effective Sample Rate Integrated Test Core for Analog and Mixed-Signal Circuits by
  • Hafed, M M
Source: Ieee Journal of Solid-State Circuits
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Explicit Analysis of Channel Mismatch Effects in Time-Interleaved Adc System by
  • Kurosawa, N
Source: Ieee Transactions on Circuits and Systems
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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