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		Grid Coverage for Surveillance and Target Location in Distributed Sensor Networks by Chakrabarty, K Lyengar, V Source: IEEE TransactionsonComputers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Test Bus Sizing for System-on-A-Chip by Lyengar, V Chakrabarty, K Source: IEEE TransactionsonComputers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Huffman Encoding of Test Sets for Sequential Circuits. by Murray, B. T Lyengar, V Source: Ieee Transactions on Instrumentation and Measurement Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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