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An Analysis OfKink Phenomena in Inalas/Ingaas Hemt'S Using Two-Dimensional Device Simulation by
  • Suemitsu, T
  • Enoki, Takatomo
  • Sano, N
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Impact of Recess-Etchin-Assisting Resist-Openings onShapes of Gate Grooves for Short Gate Lengrh Inaias/Ingaas Heterojunction Fet'S by
  • Xu, Dong
  • Enoki, Takatomo
  • IshII, Yasunobu
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A 10-Gb/S Data-Pattern Independent Clock and Data Recovery Circuit with A Two-Mode Phase Comparator by
  • Ishii, Kiyoshi
  • Enoki, Takatomo
  • Shibata, Tsugumichi
Source: Ieee Journal of Solid-State Circuits
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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