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A Comparative Analysis OfDynamic Behavior of Btg/Soi Mosfet'S and Circuits with Distriuted Body Resistance by
  • Workman, Glenn O
  • Fossum, Jerry G
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Physical Modeling of Temperature Dependences of Soi Cmos Devices and Circuits Including Self-Heating by
  • Workman, Glenn O
  • Fossum, Jerry G
  • Krishnan, S. R
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Physical Modeling of Temperature Dependences of Soi Cmos Devices and Circuits Including Self-Heating by
  • Workman, Glenn O
  • Fossum, Jerry G
  • Krishnan, S. R
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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