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A Novel High Er Formance Scan Architecture with Dmuxed Scan Flip-Flop for Low Shift Power Testing by
  • Kim, Jung-Tae
  • Kim, Insoo
  • Kim, Yong-Hyun
Source: Journal of Electrical Engineering and Technology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Scan Celi Grouping Algorith for Low Power Design by
  • Kim, Insoo
  • Min, Hyoung Bok
Source: Journal of Electrical Engineering and Technology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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