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		Software-Implemented Edac Protection Against Seus by Saxena, Nirmal R Mccluskey, Edward J Source: IEEE Transactions on Reliability Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Common-Mode Failures in Redundant Vlsi Systems: a Survey by Mitra, Subhasish Saxena, Nirmal R Mccluskey, Edward J Source: IEEE Transactions on Reliability Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Hydrogen Production By Chemically Reacting Species by Saxena, Nirmal R Source: International Journal of Hydrogen Energy Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Physics-Based Analytical Modeling of Potential and Electrical Field Distribution in Dual Material Gate (Dmg)-Mosfet by Saxena, Nirmal R Haldar, A Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Dependable Computing and online Testing in Adaptive and Configurable System. by Mccluskey, Edward J Saxena, Nirmal R Source: Ieee Design and Test of Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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