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Logic Design Principles with Emphasis on Testable Semicustom Circuits by
  • Mccluskey, Edward J [author]
Material type: Text Text
Language: English
Publication details: Englewood Cliffs, Nj : Printice-Hall, c1986
Online access:
Availability: Items available for loan: Circulation Section (1)Location, call number: Circulation Section 621.395 MCC.
Error Detection by Duplicated Instructions in Super-Scalar Processors by
  • Mccluskey, Edward J
  • Oh, Nahmsuk
  • Shirvani, Philip P
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Control-Flow Checking by Software Signatures by
  • Oh, Nahmsuk
  • Shirvani, Philip P
  • Mccluskey, Edward J
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Error Detection by Selective Procedure Cali Duplication for Low Energy Consumption by
  • Oh, Nahmsuk
  • Mccluskey, Edward J
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Software-Implemented Edac Protection Against Seus by
  • Saxena, Nirmal R
  • Mccluskey, Edward J
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Common-Mode Failures in Redundant Vlsi Systems: a Survey by
  • Mitra, Subhasish
  • Saxena, Nirmal R
  • Mccluskey, Edward J
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
linear Feedback Shift Register Design Using Cyclic Codes by
  • Mccluskey, Edward J
Source: IEEE Transactions on Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
linear Complexity Assertions for Sorting by
  • Barrett, Bruce E
  • Mccluskey, Edward J
Source: IEEE Transactions on Software Engineering
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Design for Autonomous Test by
  • Mccluskey, Edward J
  • Bozorgui-Nesbat, Saied
Source: IEEE Transactions on Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Design Diversity Metric and Analysis of Redundant Systems by
  • Mitra, S
  • Saxene, Nirmal R
  • Mccluskey, Edward J
Source: IEEE TransactionsonComputers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Ed4i: Error Detection By Diverse Data and Duplicated Instructions by
  • Oh, J
  • Mitra, S
  • Mccluskey, Edward J
Source: IEEE TransactionsonComputers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Dependable Computing and online Testing in Adaptive and Configurable System. by
  • Mccluskey, Edward J
  • Saxena, Nirmal R
Source: Ieee Design and Test of Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Efficient Multiplexer Synthesis Technique. by
  • Mitra, Subhasish
  • Avra, Lanae J
  • Mccluskey, Edward J
Source: Ieee Design and Test of Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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