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		Guest Editors' Introduction: Test Trade-offs Take Center Stage At Itc by Ambler, tony Source: Ieee Design and Test of Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Economics of Built-In Self-Test by Ungar, Louis Y Ambler, tony Source: Ieee Design and Test of Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Lessons in Agility from Internet-Based Development by Ambler, tony Source: Ieee Software Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Guest Editors' Introduction:Test andProduct Life Cycle. by Ambler, tony Bennetts, Ben Source: Ieee Design and Test of Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		The Economics of System-Level Testing. by Ambler, tony Farren, Des Source: Ieee Design and Test of Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A Bist and Boundary-Scan Economic Framework. by Abadir, Magdy Ambler, tony Source: Ieee Design and Test of Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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