An on-Chip March Pattern Generator for Testing Embedded Memory Cores

By: Material type: ArticleArticleDescription: 730-735 pSubject(s): In: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems
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Item type Current library Call number Vol info Status Date due Barcode
Articles Articles Periodical Section Vol.09, No.05 (Oct. 2001) Available

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