Your search returned 2 results.

Results
		Analysis of Dual-Vr Sram Cells with Full-Swing Single-Ended Bit Line Sensing for on-Chip Cache by Hamaoglu, Fatih Ye, Y Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Bit-Wise Read-Compare-Write Scheme for Low Power Read-Modify-Write Dram Operation by Park, Y.-H Choi, S Yoo, H-J Source: IET:IEE: Electronics Letters Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

Refine your search