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Electrical Noise As A Reliability Indicator in Electronic Devices and Comonents by
  • Jones, B.J
Source: Iee Proceedings:Circuits, Devices and Systems
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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The Low Frequency Noise in Reverse Biased Rectifier Diodes by
  • Marinov, O
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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