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		Microstructure Characterization of Oxide Coatings Deposited By Pulsed Excimer Laser Ablation by Chung, H Mazumder, J Source: Journal of Materials Research Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Micromachining of Mesoporous Oxide Films for Microelectromechanical System Structures by Paik, Hye-Young Source: Journal of Materials Research Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Ultralow Leakage Characteristics of Ultrathin Gate Oxides (~3 Nm) Prepared By Anodization Followed By High-Temperature Annealing by Ting, C. C Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		An Engineering Method to Extract Equivalent Oxide Thickness and Its Extension to Chanel Mobility Evaluation by Ootsuka, F Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Fast Interface Characterization of Tunnel Oxide Mos Structures by Sell, Bernhard Source: Ieee Transactions on Nanotechnology Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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