Your search returned 9 results.

Results
		The Correlation Interferometer As A Means to Measure Phase Noise of Parametric Origin by Rubiola, E Giordano, Vincent Source: Ieee Transactions on Instrumentation and Measurement Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Iimprovement in Signal-to-Noise Ratio of Rayleigh Backscattering Measurement Using Optical Low Coherence Reflectometry by Takada, Kazumasa Source: Journal of Lightwave Technology Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Soi N-Mosfet Low-Frequency Noise Measurements and Modeling from Room Temperature Up to 250 C by Dessard, V Iniguez, B Adriaensen, S Flandre, D Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		An Alternative Method for Transistor Low Frequency Noise Estimation By Measuring Phase Noise of Test Oscillator by Jevtic, Milan N Source: Microelectronics Journal Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A Novel Impedance for Fast Noise Measurements by De Dominicis, M Giannini, F Saggio, G Source: Ieee Transactions on Instrumentation and Measurement Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		High Sensitivity Noise Measurement with A Correlation Spectrum Analyzer. by Fasoli, L. G Accomando, G Sampietro, M Source: Ieee Transactions on Instrumentation and Measurement Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		on-Wafermeasuremens of Noise Temperature. by Randa, J Billinger, L Source: Ieee Transactions on Instrumentation and Measurement Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Ultralow -Noise Programmable Voltage Source. by Baracchino, L Basso, G Ciofi, C Source: Ieee Transactions on Instrumentation and Measurement Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Fast and Accurate Adc Testing Via An Enhanced Sine Wave Fitting Algorithm. by Trotta, A Giaquinto, N Source: Ieee Transactions on Instrumentation and Measurement Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

Visit counter For Websites

Copyright © Engr Abul Kalam Library, NEDUET, 2024

Report a problem