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		Drain Disturb During Chisel Programming of Nor Flash Eeproms-Physical Mechanisms and Impact of Technological Parameters by Nair, Deleep R Mahapatra, S Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Chisel Programming Operation of Scaled Nor Flash Eeproms-Effect of Voltage Scaling, Device Scaling and Technological Parameters by Mohapatra, Nihar R Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Chisel Flash Eeprom-Part I: Performance and Scaling by Mahapatra, S Shukuri, S Bude, J Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Chisel Flash Eeprom-Part Ii: Reliability by Mahapatra, S Shukuri, S Bude, J Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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