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Short and Long Loop Manufacturing Feedback Using a Multisensor Assembly Test Chip by
  • Tuck, Melanie R
  • Sweet, James N
Source: IEEE Transactions on Components Hybrids and Manufacturing Technology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
on Some Unresolved Issues in Finding Optimum Distributed Detection Schemes. by
  • Yan, Q
  • Blum, R. S
Source: Ieee Transactions on Signal Processing
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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