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The Pmc System Level Fault Model: Cardinality Properties OfImplied Faulty Sets by
  • Kennedy, Mary Ann
  • Meyer, Gerard G.L
Source: IEEE Transactions on Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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The Estimation of Parameters OfHypergeometric Distribution and its Application ToSoftware Reliability Growth Model by
  • Tohma, Yoshihiro
  • Yamano, Hisashi
  • Jacoby, Raymond
Source: IEEE Transactions on Software Engineering
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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