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		The Reliability of Single-Error Protected Computer Memories by Goodman, Rodney Blaum, Mario Mceliece, Robert Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		The Reliability of Memory with Single-Error Correction by Bartoldus, R.W Rutledge, R.A Mikhail, W.F Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		onPhysical Mechanism ofNrom Memory Erase by Larcher, Luca Pavan, Paolo Eitan, Boaz Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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