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		onDefinition Of'Best' Confidence Interval by Goodman, J Source: Reliability Engineering : an International Journal Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Reasoning About in Higher-Level Language Software by Shaw, Alan C Source: IEEE Transactions on Software Engineering Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Validated Solutions of Initial Value Problems for Parametric Odes by Lin, Youdong Source: Applied Numerical Mathematics Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Sensitivity Analysis Using Probability Bounding by Ferson, Scott Troy, W Source: Reliability Engineering and System Safety Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Novel Robust Stability Criteria for Interval-Delayed Hopfield Neural Networks by Liao, X Wong, K. W Source: Ieee Transactions on Circuits and Systems, I: Fundamental Theory and Applications Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Comments on "Worst-Case tolerance Analysis of Linear Analog Circuits Ucing Sensitivity Bands by Kolev, L Source: Ieee Transactions on Circuits and Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Author'S Reply by Tian, M. W Source: Ieee Transactions on Circuits and Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Worst Case tolerance Analysis of Linear Analog Circuit Using Sensitivity Bands. by Shi, C. J. R Tian, M. W Source: Ieee Transactions on Circuits and Systems, I: Fundamental Theory and Applications Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Logarithmic Reduction ofWrapping Effect with Application to Ordinary Differential Equations by Gambill, Thomas N Skeel, Robert D Source: Siam Journal on Numerical Analysis Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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